Author Affiliations
Abstract
1 Key Laboratory of Pulsed Power, Institute of Fluid Physics, China Academy of Engineering Physics, P.O. Box 919-108, Mianyang 621999, China
2 Southwest University of Science and Technology, Mianyang City, Sichuan Province 621010, China
Jets are commonly observed astrophysical phenomena. To study the x-ray emission characteristics of jets, a series of radial foil Z-pinch experiments are carried out on the Primary Test Stand at the Institute of Fluid Physics, China Academy of Engineering Physics. In these experiments, x-ray emission ranging from the soft region (0.1–10 keV) to the hard region (10 keV–500 keV) is observed when the magnetic cavity breaks. The radiation flux of soft x-rays is measured by an x-ray diode and the dose rate of the hard x-rays by an Si-PIN detector. The experimental results indicate that the energy of the soft x-rays is several tens of kilojoules and that of the hard x-rays is ～200 J. The radiation mechanism of the x-ray emission is briefly analyzed. This analysis indicates that the x-ray energy and the plasma kinetic energy come from the magnetic energy when the magnetic cavity breaks. The soft x-rays are thought to be produced by bremsstrahlung of thermal electrons (～100 eV), and the hard x-rays by bremsstrahlung of super-hot electrons (～mega-electron-volt). These results may be helpful to explain the x-ray emission by the jets from young stellar objects.
Matter and Radiation at Extremes
2020, 5(1): 014401
山东大学 空间科学与物理学院, 山东 威海 264209
以P型<100>硅作为衬底, 采用射频磁控溅射技术, 在室温下制备了氮掺杂氧化铟锡锌薄膜晶体管(ITZO TFTs), 研究了氮气流量对氧化铟锡锌薄膜晶体管结构、光学、电学特性以及稳定性的影响。实验结果表明: 在不同氮气流量条件下制备的氧化铟锡锌薄膜均为非晶态, 在可见光范围内的平均透过率均在90%左右, 光学带隙数值在3.28~3.32 eV之间变化。在氮气流量为4 mL/min时制备的ITZO TFTs, 有源层与栅极电介质界面处的界面态密度(Nmaxs)仅为4.3×1011 cm-2, 场效应迁移率( μFE )为18.72 cm2/(V·s), 开关比(Ion/off)为106, 亚阈值摆幅(S)为 0.39 V/dec, 电学性能最优。栅极正偏压应力测试结果表明, 该器件具有最强的稳定性。因此, 适量的氮掺杂可有效地实现器件氧空位的钝化, 降低器件的界面态密度, 提高ITZO TFTs的电学性能及稳定性。
氧化铟锡锌薄膜晶体管 射频磁控溅射 氮掺杂 界面态密度 ITZO TFTs RF magnetron sputtering nitrogen doping interface state density
